AFM-in-SEM applications

Unique Atomic Force Microscope LiteScope is designed to merge the strengths of AFM and SEM technology, resulting in effective workflow and possibilities of in-situ analysis that was difficult or readily impossible by conventional instrumentation.

Simultaneous measurement allows nanometer precise in-time AFM and SEM correlative analysis, making LiteScope powerful tool for the variety of fields such as Material science, Nanotechnology, Semiconductors, Life science and other areas of research and industry.