AFM-in-SEM LiteScope on the Cover of a Key Study on Diamond-Coated Probes
Researchers have developed a low-temperature plasma process to coat self-sensing AFM probes with boron-doped nanocrystalline diamond, boosting durability and sensitivity. This breakthrough enables precise electrical mapping of micro- and nanostructures in air and vacuum, advancing semiconductor technology.
Impact of Electron Irradiation on WS2 Nanotube Devices
Uncover the hidden effects of electron beam exposure on WS2 nanotubes and learn why understanding substrate charging is crucial for accurate prototyping and reliable device performance in next-generation electronics.
Enhancing Thermoplastic Starch with Maltodextrin: Key Properties and Performance Insights
Ever wondered how improving thermoplastic starch with maltodextrin can enhance its preparation, morphology, rheology, and mechanical properties? Discover the effects and how these improvements lead to greater efficiency in both technical and biomedical applications.
3D Surface Roughness Measurement of Core–Shell Microparticles
Researchers used AFM-in-SEM LiteScope to develop a new method for measuring the surface roughness of spherical microparticles. By integrating AFM with SEM, LiteScope enabled quasi-3D roughness data, providing more detailed analysis than traditional 2D methods.
ZrN coating as a source for the synthesis of a new hybrid ceramic layer
New Study Explores ZrN Coating as a Source for Hybrid Ceramic Layers with LiteScope Technology.
Advancements in graphene nanopatterning using focused electron-beam-induced etching
Researchers strive to unlock the potential of graphene, but precise manipulation remains challenging. In-situ experiments using the AFM-in-SEM LiteScope explore how electron-beam exposure affects SiO2 substrate morphology. Findings reveal subtle effects, guiding the optimization of nanopatterning processes for enhanced graphene-based device development.
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