Battery Component Materials Analyses

A unique AFM-in-SEM solution with LiteScope for in-situ correlative analysis of cathodes, enabling comprehensive electrical and chemical characterization of active material properties and their changes caused by battery cycling.


The LiteScope workflow allows for an air-free sample transfer system that prevents contamination by oxygen and humidity. Focus on the characterization of performance, understanding cycling effects, active material degradation, inter/intraparticle connectivity, and delamination. 

The AFM-in-SEM solution provides a complete hardware and measurement workflow approach. It allows for an air-free sample transfer system that prevents contamination by oxygen and humidity while ensuring uncompromised sample surface preparation

Key Added Values

Site-specific local resistivity of individual particles


Characterization of local electrical properties, including conductivity and resistivity, in cathode active materials (CAM) and other cathode components. 

In-situ performance and degradation analyses within your SEM

Analysis of battery formation and cycling effects on cathode materials, focusing on changes, degradation, and their impact on overall performance and lifespan.

Complementary to SEM analytical capabilities


Techniques like FIB and EDX, integrated with AFM-in-SEM LiteScope, for detailed analysis of battery materials.

No air or humidity exposure of sensitive materials


All in-situ analyses are performed in the protective vacuum environment of SEM, preserving all battery material surfaces from oxidation, changes, or contamination.

Application areas

  • Cell and battery components
  • Raw active materials
  • Cathodes
  • Anodes
  • Solid electrolytes
  • Liquid electrolytes

Testimonials

Thanks to LiteScope AFM-in-SEM technology, we can analyze the properties of active materials and their interactions with other parts of the electrode and electrolyte. This technology also allows us to better understand the degradation processes of electrode materials during cycling in terms of the interaction of individual grains of polycrystalline cathode materials at submicroscopic and microscopic levels. A better understanding of the degradation processes could help to prevent it and improve of the performance of the new types of Li-ion batteries.

doc. Ing. Tomáš Kazda, Ph.D.
Brno University of Technology / Associate Professor

We have been collaborating with the Nenovision team on SSB cathode analysis and have found their technology highly valuable for assessing conductivity together with SEM imaging. The insights from conductivity measurements have been crucial in evaluating the quality of SSB electrodes and their integrity after cycling. Additionally, the detailed surface morphology analysis offered by the Litescope has enabled us to identify microstructural changes post-cycling. We are convinced that the combination of SEM and AFM provided by Nenovision's Litescope device is essential for understanding battery performance and facilitating improvements in battery technology.


Dr. Aleksandr Kondrakov
BASF / SE Lab Team Leader

Measurement workflow

LiteScope ensures samples are not exposed to air during transfer and examination, utilizing a Sample Transfer System to preserve the integrity of battery materials. Battery materials, whether cathodes, solid-state electrolytes, or other components, are usually composed of particles of various sizes. To prepare samples suitable for AFM and SEM analysis, we use ion beam milling to create cross-sections of the specimens. The milling can be performed either ex-situ, outside the SEM in a dedicated Broad Ion Beam device, or in-situ, inside a dual-beam FIB-SEM microscope using a Focused Ion Beam. Since the battery samples are typically air-sensitive, the transfer between the Glovebox, Broad Ion Beam device, and SEM is conducted using a Sample Transfer Module.



1. Ex-situ sample preparation using Sample Transfer System

This option allows larger cross-section preparation in specialized instruments while maintaining the sample surface in the necessary environment, even during transfer




2. In-situ sample preparation using Focused Ion Beam

LiteScope enables safe AFM probe positioning for large stage tilts, preserving the tip from redeposition and allowing the use of FIB to cut a trench anywhere on the sample. This allows measurement of the uncovered surface using AFM-in-SEM technology.

Key Benefits and Features

Fast and easy sample transfer


The short evacuation time allows for quick and efficient sample exchanges. This minimizes downtime and ensures that samples are handled in a controlled environment, preserving their integrity and preventing contamination.


No air or humidity exposure


Air-sensitive samples are protected from surface contamination or oxidation in a vacuum or inert gas atmosphere at all times.


Complete measurement workflow

A comprehensive procedure for the cross-sectional analysis of complex battery components and materials testing.


Upgrade to SEM solution


Extended possibilities are enabled using FIB/GIS prep, AFM, C-AFM, KPFM, phase imaging, SE, BSE, EDX, Fz spectroscopy, etc.


Webinar

Watch our webinar to delve deeper into the key benefits of employing AFM-in-SEM for the characterization of battery materials.


  • Key challenges in the characterization of batteries and their components and how AFM-in-SEM technology resolves them.
  • Efficient sample preparation workflow of extremely air-sensitive battery samples, their cross-sectioning, and sample transfer to integrated AFM/SEM/EDX instrument.
  • Application examples of in-situ correlative microscopy analysis of various cathode materials (NCM, NCA) in pristine and cycled stages. We will demonstrate how AFM-in-SEM is used to understand the degradation process inside the cathodes.


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