Akiyama
The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time.
Measurement modes: Topography, Energy dissipation
NenoProbe Magnetic
Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama.
Measurement modes: Topography, MFM
NenoProbe Conductive
Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy.
Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy
Piezo-resistive probes
AFM probe suitable for both dynamic and contact mode topography measurements and F-Z spectroscopy.
Measurement modes: Topography, F-z spectroscopy
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3D Surface Roughness Measurement of Core–Shell Microparticles
Researchers used AFM-in-SEM LiteScope to develop a new method for measuring the surface roughness of spherical microparticles. By integrating AFM with SEM, LiteScope enabled quasi-3D roughness data, providing more detailed analysis than traditional 2D methods.
ZrN coating as a source for the synthesis of a new hybrid ceramic layer
New Study Explores ZrN Coating as a Source for Hybrid Ceramic Layers with LiteScope Technology.
