Workshop Invitation at TU Munich

Workshop Invitation at TU Munich

Exploring the Future of Materials Characterization by AFM-in-SEM and In-Situ Correlative Microscopy

This event is designed to provide insights into our cutting-edge AFM-in-SEM technology and its applications in Material Science, including applications in battery research, 2D materials, and others.


Why Attend?

  • Learn about AFM-in-SEM and In-Situ Correlative Microscopy from experts in the field
  • Live Hands-On Demonstration Session with AFM-in-SEM
  • Discover New Applications and Research Possibilities using LiteScope (AFM-in-SEM)
  • Enjoy Networking with industry and academic colleagues 


Event Details

DateDecember 10th, 2024
Time13:00 – 17:00 CET
LocationTechnical University of Munich
OrganizersNenoVision, TU Munich (TUM), and Physical Electronics

Please note that participation is limited to 25 participants, so be sure to register early!

Our Speakers

Jan Neuman
Jan Neuman
CEO of NenoVision and in-situ enthusiast
Marc Willinger
Marc Willinger
Chairholder at TUM and LiteScope user

Workshop Program



We look forward to your participation in this unique opportunity to explore how our technology can advance your research and industry applications. If you have any questions, feel free to contact us.


Please register down below to confirm your attendance.


Register Here