LiteScope represents a unique solution for correlative in-situ analysis of special structural features of samples at nanoscale. Use the power of the AFM-in-SEM to analyse nanopillars, nanowires and other surface structures combining the advantages of AFM tip navigation inside of the SEM chamber.
Or take the advantage on in-situ conditions inside the chamber to perform AFM analysis of FIB or GIS modified structures withnout exposure to external conditions. The SEM guided AFM tip will enable you to find easily precisely the structure you need for your research!
