"In-situ nanoindentation and AFM within your SEM" in the AMMS Newsletter

Thanks to our partners from AXT PTY LTD, LiteScope has been mentioned in the Australian Microscopy & Microanalysis Society newspaper. Namely, the article describes the advantages of combining AFM, SEM, and a Nanoindentation module.

Three key benefits of this combination are elaborated:

Precision

• Precise localization of nanostructures
• Co-localisation of related SEM techniques

Accuracy

• Pre-indentation area survey
• Observation of indentation after-effects

Efficiency

• Fast nanoindentation and AFM targeting using SEM easily repeatable localization of the same area

Learn more about LiteScope and the Nanoindentation module!

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