In-Situ Microscopy Alliance USA Workshop Series

In-Situ Microscopy Alliance USA Workshop Series

One-day workshop series to learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc.) and hear about applications from the users.

Workshops will take place at two locations in the USA, offering a unique opportunity to explore the in-situ solutions developed by the four partners of the alliance. Participants will have the opportunity to meet In-situ Microscopy Alliance: Alemnis, Imina, Nenovison and point electronic. If you're interested in mechanical, electrical, and optical characterization methods, join us! A wide variety of applications will be presented to cover different aspects of your research projects.

Covalent Metrology

Date:    Apr. 23, 2024

Time:    9:00 to 15:30

Place:   Covalent Metrology, Sunnyvale, CA, USA

Number of participants is limited to 30.


Registration

MIT

Date:    Apr. 25, 2024

Time:    9:00 to 14:30

Place:    Massachusetts Institute of Tech. (MIT), Boston, MA, USA

Number of participants is limited to 40.


Registration

Preliminary Program

09:00 - 09:45    Registration and Coffee

09:45 - 10:00    Introduction of the In-situ Microscopy Alliance (IMA)

10:00 - 10:30    Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis

10:30 - 11:00    Mechanics of architected materials through the lens of in situ characterization, Prof. Carlos Portela, MIT

11:00 - 11:15    Break and networking

11:15 - 11:45    Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies

11:45 - 12:15    User presentation

12:15 - 13:30    Lunch

13:30 - 14:00    AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Mr. Jan Neuman, NenoVision

14:00 - 14:30    Benefits of AFM-in-SEM for applications in material science and battery research, Mr. Jan Neuman, NenoVision

14:30                    End of the seminar, open discussion