AFM-in-SEM LiteScope 2.5: Redefining In-Situ Correlative Analyses

You can now watch the recording of the webinar held on 26.4. 2023.

During this webinar Jan Neuman, the CEO of NenoVision together with Petr Klapetek, who is a group leader at the Czech Metrology Institute in Brno have taken you through the following topics:

• Introduction to AFM-in-SEM and In-Situ Correlative Microscopy
• Discover key Innovations and features of LiteScope 2.5
• Open Hardware/Software Philosophy