Key benefits in the characterization of Powders, Particles, and 2D materials by AFM-in-SEM

NenoVision

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Key takeaways

Techniques for effectively measuring and determining the surface roughness of powders and particles.
How AFM-in-SEM supports the analysis of mechanical and magnetic properties, allowing for comprehensive characterization of particles beyond surface roughness.
The importance of multimodal study of low-dimensional materials for understanding the advanced properties of new functional 2D materials.
Practical examples from the pharmaceutical and ceramic industries.

The importance of multimodal studies of low-dimensional materials in understanding the advanced properties of new functional 2D materials.

Practical examples from the pharmaceutical and ceramic industries introduced by Veronika.

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Application areas

One of the few use cases in the webinar

Surface roughness in pharmaceutical industry

In the pharmaceutical industry, measuring surface roughness can be helpful in targeted drug delivery. In the webinar, Veronika describes how the surface roughness of carrier particles with and without the active pharmaceutical ingredient (API) can differ according to where and how the API is bound. Such insights enable the evaluation of how effective the carriers can be and contribute to further development of targeted drug delivery technology.

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We have recently acquired the NenoVision AFM. This AFM is running inside the chamber of one of our SEMs and it enables us to do a correlative study of all materials. We can combine whatever we see in the SEM with whatever the AFM delivers. There are so many things you can do with such an AFM. It's like having a Swiss army knife inside the chamber of your SEM.

Marc-Georg Willinger

TU Munich / Professor

We have greatly appreciated every aspect of our collaboration with NenoVision. Our communication has been smooth, efficient, and informative. By utilizing their novel CPEM technology, NenoVision helped us gain unique 3D information about our nano-sized samples deposited on cm-sized substrates. The unique ability to utilize both SEM and AFM at the same time allowed us to directly correlate the size and mechanical properties of silk nanowires. We truly appreciated all the assistance we received from NenoVision and hope to continue this fruitful collaboration in the future.

Wouter Metsola van der Wijngaart

Department of Micro and Nanosystems, KTH Royal Institute of Technology / Deputy head of Department

LiteScope is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective. I am honored that our institute has a serial number 01.